Effects of Low Energy E-Beam Irradiation on Graphene and Graphene Field Effect Transistors and Raman Metrology of Graphene on Split Gate Test Structur (Paperback)
  • Effects of Low Energy E-Beam Irradiation on Graphene and Graphene Field Effect Transistors and Raman Metrology of Graphene on Split Gate Test Structur (Paperback)

Effects of Low Energy E-Beam Irradiation on Graphene and Graphene Field Effect Transistors and Raman Metrology of Graphene on Split Gate Test Structur (Paperback)

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Paperback Published: 01/10/2012
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Publisher: Proquest, Umi Dissertation Publishing
ISBN: 9781249859079

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