Dopants and Defects in Semiconductors covers the theory, experimentation, and identification of impurities, dopants, and intrinsic defects in semiconductors. The book fills a crucial gap between solid-state physics and more specialized course texts.
The authors first present introductory concepts, including basic semiconductor theory, defect classifications, crystal growth, and doping. They then explain electrical, vibrational, optical, and thermal properties. Moving on to characterization approaches, the text concludes with chapters on the measurement of electrical properties, optical spectroscopy, particle-beam methods, and microscopy.
By treating dopants and defects in semiconductors as a unified subject, this book helps define the field and prepares students for work in technologically important areas. It provides students with a solid foundation in both experimental methods and the theory of defects in semiconductors.
Publisher: Taylor & Francis Inc
Number of pages: 390
Weight: 839 g
Dimensions: 254 x 178 x 23 mm
"The book goes beyond the usual textbook in that it provides more specific examples of real-world defect physics ... The book will be most useful for beginning graduate students in materials science. ... an easy reading, broad introductory overview of the field ..."
-Materials Today, July-August 2012
"... well written, with clear, lucid explanations ..."
"The scientific development towards the method of controllable doping transformed the erratic and not reproducible family of semiconductor materials into the truly wonderful basis of modern microelectronics. This book tells the remarkable success story and I recommend it!"
-Hans J. Queisser, Max-Planck-Institute, Stuttgart, Germany
"McCluskey and Haller have written an outstanding modern guide to this field that will be useful to newcomers, and also to active researchers who want to broaden their horizons, as a means to learn the capabilities and limitations of the many techniques that are used in semiconductor-defect science."
-Professor Michael J. Stavola, Lehigh University
"This clearly written text about defects in macroscopic semiconductor materials comprehensively bridges the gap between basic science courses and research-level reviews: a must for workers new to the field."
-Professor Gordon Davies, King's College London