Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering 2 (Hardback)Telman Aliev (author)
- We can order this
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.
Publisher: Springer-Verlag New York Inc.
Number of pages: 224
Weight: 1120 g
Dimensions: 235 x 155 x 14 mm
Edition: 2007 ed.
From the reviews:"The monograph builds on a long series of publications by the author over the last decade. ... monograph should benefit researchers and practicing engineers ... particularly those in search of new application tools in quality engineering applied in a broad setting. ... In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry." (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)
You may also be interested in...
Please sign in to write a review