Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science 68 (Hardback)
  • Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science 68 (Hardback)
zoom

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science 68 (Hardback)

(editor), (editor)
£219.99
Hardback 554 Pages / Published: 26/11/2003
  • We can order this

Usually despatched within 3 weeks

  • This item has been added to your basket

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN: 9783540405191
Number of pages: 554
Weight: 2180 g
Dimensions: 235 x 155 x 31 mm
Edition: 2004 ed.

You may also be interested in...

The Oxford Solid State Basics
Added to basket
Model Aircraft Aerodynamics
Added to basket
Mechanics of Fluids, Ninth Edition
Added to basket
Thermodynamics DeMYSTiFied
Added to basket
Thermodynamics for Dummies
Added to basket
Mechanics
Added to basket
£49.99
Paperback
The Solid State
Added to basket
£49.99
Paperback
The Simple Science of Flight
Added to basket
Biomaterials
Added to basket
£69.99
Paperback
Reinforced Concrete Design
Added to basket
Mechanics of Materials For Dummies
Added to basket

Reviews

Please sign in to write a review

Your review has been submitted successfully.