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Design for Yield and Reliability for Nanometer CMOS Digital Circuits (Paperback)
  • Design for Yield and Reliability for Nanometer CMOS Digital Circuits (Paperback)
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Design for Yield and Reliability for Nanometer CMOS Digital Circuits (Paperback)

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£50.00
Paperback Published: 26/01/2014
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Publisher: LAP Lambert Academic Publishing
ISBN: 9783659513619
Weight: 435 g
Dimensions: 229 x 152 x 17 mm

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