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Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering 115 (Paperback)
  • Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering 115 (Paperback)
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Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering 115 (Paperback)

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£89.99
Paperback 124 Pages / Published: 15/10/2014
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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Publisher: Springer
ISBN: 9789400797987
Number of pages: 124
Weight: 2175 g
Dimensions: 235 x 155 x 7 mm
Edition: 2013 ed.

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