Defects in SiO2 and Related Dielectrics: Science and Technology: Defects in SiO2 and Related Dielectrics: Science and Technology Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 - NATO Science Series II 2 (Paperback)Gianfranco Pacchioni (editor), Linards Skuja (editor), David L. Griscom (editor)
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This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
Number of pages: 624
Weight: 1940 g
Dimensions: 240 x 160 x 32 mm
Edition: Softcover reprint of the original 1st ed. 200
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