Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices - NATO Science Series II 220 (Paperback)Evgeni Gusev (editor)
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Publisher: Springer-Verlag New York Inc.
Number of pages: 492
Weight: 1560 g
Dimensions: 235 x 155 x 25 mm
Edition: 2006 ed.
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