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Debug Automation from Pre-Silicon to Post-Silicon (Hardback)
  • Debug Automation from Pre-Silicon to Post-Silicon (Hardback)

Debug Automation from Pre-Silicon to Post-Silicon (Hardback)

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Hardback 171 Pages / Published: 09/10/2014
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This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.

Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

Publisher: Springer International Publishing AG
ISBN: 9783319093086
Number of pages: 171
Weight: 450 g
Dimensions: 235 x 155 x 13 mm
Edition: 2015 ed.

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