Contactless VLSI Measurement and Testing Techniques (Hardback)
  • Contactless VLSI Measurement and Testing Techniques (Hardback)
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Contactless VLSI Measurement and Testing Techniques (Hardback)

(author)
£109.99
Hardback 93 Pages / Published: 04/12/2017
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This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.

Publisher: Springer International Publishing AG
ISBN: 9783319696720
Number of pages: 93
Weight: 339 g
Dimensions: 235 x 155 mm
Edition: 1st ed. 2018

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