The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Publisher: Springer-Verlag New York Inc.
Number of pages: 194
Weight: 1050 g
Dimensions: 235 x 155 x 12 mm
Edition: 2008 ed.
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