Visit our Christmas Gift Finder
Click & Collect from 2 Hours
Last Christmas Delivery Dates
Free UK Standard Delivery on orders £20 and over Order in time for Christmas 18th December 2nd Class | 19th December 1st Class Free Click & Collect to shops From 2 hours of your order*
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - Frontiers in Electronic Testing 40 (Hardback)
  • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - Frontiers in Electronic Testing 40 (Hardback)
zoom

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - Frontiers in Electronic Testing 40 (Hardback)

(author), (author)
£129.99
Hardback 194 Pages / Published: 21/06/2008
  • We can order this

Usually dispatched within 3 weeks

  • This item has been added to your basket

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Publisher: Springer-Verlag New York Inc.
ISBN: 9781402083624
Number of pages: 194
Weight: 1050 g
Dimensions: 235 x 155 x 12 mm
Edition: 2008 ed.

You may also be interested in...

The Lego Mindstorms Ev3 Discovery Book
Added to basket
Getting Started with Arduino
Added to basket
Exploring Arduino
Added to basket
£26.99
Paperback
Electronics For Dummies
Added to basket
Arduino in Easy Steps
Added to basket
Make: More Electronics
Added to basket
The Oxford Solid State Basics
Added to basket
Electronics All-in-One For Dummies - UK
Added to basket
Make: Analog Synthesizers
Added to basket
Arduino For Dummies
Added to basket
£16.99
Paperback
Arduino Cookbook
Added to basket
Arduino Projects For Dummies
Added to basket

Reviews

Please sign in to write a review

Your review has been submitted successfully.