Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the "Materials Characterization" series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. Readers will find detailed information on: various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy; concise summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM).
Publisher: Momentum Press
Number of pages: 276
Weight: 1 g
Dimensions: 241 x 157 x 19 mm
You may also be interested in...
£52.99Mixed media product
Please sign in to write a review
Thank you for your reservation
Your order is now being processed and we have sent a confirmation email to you at
When will my order be ready to collect?
Call us on or send us an email at
Unfortunately there has been a problem with your order
Please try again or alternatively you can contact your chosen shop on or send us an email at