Characterization of Crystal Growth Defects by X-Ray Methods - NATO Science Series B 63 (Paperback)B. K. Tanner (author)
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Publisher: Springer-Verlag New York Inc.
Number of pages: 589
Weight: 1156 g
Dimensions: 254 x 178 x 31 mm
Edition: Softcover reprint of the original 1st ed. 198
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