Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science 352 (Hardback)Hisham Haddara (editor)
- We can order this
Number of pages: 232
Weight: 1170 g
Dimensions: 235 x 155 x 15 mm
Edition: 1995 ed.
You may also be interested in...
Please sign in to write a review