Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science 352 (Paperback)Hisham Haddara (editor)
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Publisher: Springer-Verlag New York Inc.
Number of pages: 232
Weight: 391 g
Dimensions: 235 x 155 x 13 mm
Edition: Softcover reprint of the original 1st ed. 199
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