Atomic-Scale Characterization of Embedded and Supported Nanostructures by Scanning Transmission Electron Microscopy (Paperback)
  • Atomic-Scale Characterization of Embedded and Supported Nanostructures by Scanning Transmission Electron Microscopy (Paperback)
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Atomic-Scale Characterization of Embedded and Supported Nanostructures by Scanning Transmission Electron Microscopy (Paperback)

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£59.00
Paperback Published: 01/09/2011
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Publisher: Proquest, Umi Dissertation Publishing
ISBN: 9781244609280
Weight: 313 g
Dimensions: 246 x 189 x 9 mm

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