Atomic Force Microscopy of Polymers: From High-Resolution Imaging to Probing Local Mechanical Properties (Hardback)Sergei N. Magonov (author), Natalya Yerina (author), Sergey Belikov (author)
Hardback 320 Pages
"Atomic Force Microscopy of Polymers: From High-Resolution Imaging to Probing Local Mechanical Properties" gives background information on how the atomic force microscope (AFM) was developed, how it is used for characterization techniques, and how it complements such techniques. The book details how to properly use this instrument, including preparing samples and developing theoretical models with the information from AFM-generated images.
Publisher: John Wiley and Sons Ltd
Number of pages: 320
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