Asian Test Symposium Proceedings: 3rd (Paperback)Institute of Electrical and Electronics Engineers (author)
Paperback 206 Pages / Published: 31/10/1996
- Not available
The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for te
Publisher: IEEE Computer Society Press,U.S.
Number of pages: 206
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