Asian Test Symposium Proceedings: 2nd (Paperback)
  • Asian Test Symposium Proceedings: 2nd (Paperback)
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Asian Test Symposium Proceedings: 2nd (Paperback)

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£63.50
Paperback 274 Pages / Published: 01/12/1993
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Proceedings of the 2nd Asian Test Symposium held in Beijing, China, in November 1993. Among the topics: fault tolerance, analog and mixed circuit testing, and testability analysis. No index. Annotation copyright Book News, Inc. Portland, Or.

Publisher: IEEE Computer Society Press,U.S.
ISBN: 9780818639302
Number of pages: 274
Weight: 816 g
Dimensions: 273 x 216 x 19 mm

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