Asian Test Symposium 10th Anniversary Compendium of Papers 2001 (Paperback)IEEE (author)
Paperback 380 Pages / Published: 01/01/2001
- Not available
Fifty-five papers are collected from ten years of meetings of the Asian Test Symposium, an international forum that discusses aspects of system, board, chip, and device testing in light of design, manufacturing, and field considerations. Specific topics include a concurrent fault detection method fo
Number of pages: 380
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