Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation. Surfaces, interfaces, electronic materials, thin films, carbides, polymers and alloys are all addressed. And while the editors did not anticipate that the cluster of papers treating cementitious materials would necessitate a separate section, it is interesting to see the application of cutting-edge techniques to Portland cement, a very complex materials system long used in engineering structures. Topics include: X-ray diffraction - structures and transformations; X-ray diffraction - stress, strain and texture; microtomography and microdiffraction; SR methods applied to cementitious materials; magnetic materials; X-ray absorption and photoemission; and X-ray scattering and interfaces.
Publisher: Cambridge University Press
Weight: 300 g
Dimensions: 229 x 152 x 12 mm
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