Annual Electrical Overstress/Electrostatic Discharge Symposium: 19th (Paperback)Institute of Electrical and Electronics Engineers (author)
Paperback 400 Pages / Published: 31/12/1997
- Not available
This text covers the electrical overstress (EOS) and electrostatic discharge (ESD) phenomena and protection issues for semiconductor devices and components. These issues include: device physics; protection circuits; testing and measurement; factory control; materials; and system effects.
Number of pages: 400
Dimensions: 279 x 216 mm
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