Advances in X-Ray Analysis: Volume 2 Proceedings of the Seventh Annual Conference on Applications of X-Ray Analysis Held August 13-15, 1958 (Paperback)William M. Mueller (author)
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Publisher: Springer-Verlag New York Inc.
Number of pages: 353
Weight: 527 g
Dimensions: 229 x 152 x 19 mm
Edition: Softcover reprint of the original 1st ed. 196