Advances in X-Ray Analysis: Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6-8, 1969 (Paperback)Burton L. Henke (editor)
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Publisher: Springer-Verlag New York Inc.
Number of pages: 682
Weight: 1303 g
Dimensions: 254 x 178 x 35 mm
Edition: Softcover reprint of the original 1st ed. 197
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