Advances in X-ray Analysis: Volume 20 (Paperback)Howard F. McMurdie (editor)
- We can order this
Publisher: Springer-Verlag New York Inc.
Number of pages: 604
Weight: 1171 g
Dimensions: 254 x 178 x 32 mm
Edition: Softcover reprint of the original 1st ed. 197
You may also be interested in...
Please sign in to write a review