Advances in Imaging and Electron Physics: Volume 166: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics (Hardback)Peter W. Hawkes (series editor)
Hardback 392 Pages / Published: 06/12/2010
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Publisher: Elsevier Science Publishing Co Inc
Number of pages: 392
Weight: 660 g
Dimensions: 229 x 152 mm
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