Advanced Trace Analysis (Hardback)Susanta Lahiri (editor)
Hardback 188 Pages / Published: 26/01/2010
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Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium relevant to waste disposal and management along with the use of greener techniques for trace elemental speciation analysis.
Publisher: Narosa Publishing House
Number of pages: 188
Weight: 590 g
Dimensions: 240 x 185 x 15 mm
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