A Probabilistic Analysis of Test-Response Compaction (Paperback)
  • A Probabilistic Analysis of Test-Response Compaction (Paperback)
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A Probabilistic Analysis of Test-Response Compaction (Paperback)

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£22.50
Paperback 112 Pages / Published: 28/02/1995
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Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc

Publisher: IEEE Computer Society Press,U.S.
ISBN: 9780818665325
Number of pages: 112
Weight: 218 g
Dimensions: 270 x 179 x 8 mm

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