A Designer's Guide to Built-In Self-Test - Frontiers in Electronic Testing 19 (Paperback)Charles E. Stroud (author)
- We can order this
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Publisher: Springer-Verlag New York Inc.
Number of pages: 320
Weight: 528 g
Dimensions: 235 x 155 x 18 mm
Edition: Softcover reprint of the original 1st ed. 200
You may also be interested in...
Would you like to proceed to the App store to download the Waterstones App?