A Designer's Guide to Built-In Self-Test - Frontiers in Electronic Testing 19 (Paperback)Charles E. Stroud (author)
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Publisher: Springer-Verlag New York Inc.
Number of pages: 320
Weight: 528 g
Dimensions: 235 x 155 x 18 mm
Edition: Softcover reprint of the original 1st ed. 200
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