2003 International Conference of the Simulation of Semiconductor Processes and Devices (Sispad 2003) (Paperback)IEEE (author), International Conference on Simulation of Semiconductor Processes and Devices (2003 Bost (author)
Paperback 300 Pages / Published: 01/09/2003
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Taken from the proceedings of the 2003 International Conference of the Simulation of Semiconductor Processes and Devices (SISPAD 2003), this volume looks at electron devices.
Number of pages: 300
Dimensions: 279 x 216 x 18 mm
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