2001 IEEE International Conference on Microelectronic Test Structures (Paperback)
  • 2001 IEEE International Conference on Microelectronic Test Structures (Paperback)
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2001 IEEE International Conference on Microelectronic Test Structures (Paperback)

£122.50
Paperback 250 Pages / Published: 31/05/2001
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The conference on which this text is based is devoted to the development, measurement and analysis of test structures, providing a forum for designers and users of test structures to discuss recent developments and future directions.

Publisher: I.E.E.E.Press
ISBN: 9780780365117
Number of pages: 250
Dimensions: 279 x 216 mm

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