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19th IEEE Vlsi Test Symposium (Vts 2001) (Paperback)
  • 19th IEEE Vlsi Test Symposium (Vts 2001) (Paperback)

19th IEEE Vlsi Test Symposium (Vts 2001) (Paperback)

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£148.50
Paperback Published: 31/05/2001
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Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self-test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.

Publisher: I.E.E.E.Press
ISBN: 9780769511221

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