1999 IEEE International Reliability Physics Symposium (Paperback)IEEE Electron Devices Society (author), Institute of Electrical & Electronics Engineers (editor), Ieee Institute of Electrical & Electroni (editor), IEEE Inst of Electrical & Electronics (editor)
Paperback 458 Pages / Published: 01/09/1999
- Not available
This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.
Number of pages: 458
Dimensions: 279 x 216 mm
Edition: 1999 ed.
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