1999 IEEE International Reliability Physics Symposium (Paperback)
  • 1999 IEEE International Reliability Physics Symposium (Paperback)
Paperback 458 Pages / Published: 01/09/1999
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This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.

Publisher: I.E.E.E.Press
ISBN: 9780780352209
Number of pages: 458
Dimensions: 279 x 216 mm
Edition: 1999 ed.

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