1999 7th International Symposium on the Physical Failure Analysis of Integrated Circuits: Conference Proceedings (Paperback)IEEE Electron Devices Society (author), IEEE Reliability Society (author), IEEE Components,Packaging & Manufacturing Technology Society (author)
Paperback 212 Pages / Published: 01/09/1999
- Not available
Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.
Number of pages: 212
Edition: 1999, 7th International ed.
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