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1999 7th International Symposium on the Physical Failure Analysis of Integrated Circuits: Conference Proceedings (Paperback)
  • 1999 7th International Symposium on the Physical Failure Analysis of Integrated Circuits: Conference Proceedings (Paperback)
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1999 7th International Symposium on the Physical Failure Analysis of Integrated Circuits: Conference Proceedings (Paperback)

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£115.50
Paperback 212 Pages / Published: 01/09/1999
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Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.

Publisher: I.E.E.E.Press
ISBN: 9780780351875
Number of pages: 212
Edition: 1999, 7th International ed.

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