1994 IEEE Vlsi Test Symposium (Paperback)
  • 1994 IEEE Vlsi Test Symposium (Paperback)
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1994 IEEE Vlsi Test Symposium (Paperback)

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£81.50
Paperback 484 Pages / Published: 01/01/1994
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Proceedings of the symposium held in Cherry Hill, New Jersey, April 1994. Technical sessions are devoted to synthesis and testability; testable mixed-signal circuit designs; built-in self-test; test generation & fault simulation; on-line testing; defect coverage & test quality; advanced test generat

Publisher: IEEE Computer Society Press,U.S.
ISBN: 9780818654404
Number of pages: 484
Weight: 1157 g
Dimensions: 286 x 222 x 32 mm

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