12th Asian Test Symposium (Ats 2003) (Paperback)China) Asian Test Symposium (12th 2003 Xi'an (author)
Paperback 500 Pages / Published: 01/01/2003
- Not available
Papers from a November 2003 symposium present the latest ideas in the field of testing, in areas including design for testability, enhanced delay testing and ATPG, test power, software testing, fault diagnosis, memory testing, SOC test, DFT synthesis, test scheduling, measurement, test economics, current test, test compaction, functional testing an
Number of pages: 500
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