IEEE International Test Conference (CD-ROM)

by IEEE

Format: CD-ROM

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Topics covered include: beyond DC testing at board test; BIST medley; how can we improve IDDQ testing of DSM/VDSM; practical experience with SOC testing; problems for ATE software; lecture series test and repair of large embedded DRAMs; DFT innovations; and novel techniques of fault diagnosis.

Product details

Published
30/11/2001

Publisher
I.E.E.E.Press

ISBN
9780780371712


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