Asian Test Symposium 10th Anniversary Compendium of Papers 2001 (Paperback)

by IEEE

Format: Paperback 380 pages

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Fifty-five papers are collected from ten years of meetings of the Asian Test Symposium, an international forum that discusses aspects of system, board, chip, and device testing in light of design, manufacturing, and field considerations. Specific topics include a concurrent fault detection method fo

Book details

Published
31/12/2001

Publisher
I.E.E.E.Press

ISBN
9780769512334


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