1999 IEEE International Test Conference (CD-ROM)

by IEEE

Format: CD-ROM

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The proceedings of the 1999 IEEE Test Conference contain papers on various aspects of designing and testing computer hardware. Topics addressed include: MCM and known-good-die testing; analogue test methods; production wafer testing; and diagnosis of integrated-circuit process defects.

Product details

Published
31/10/1999

Publisher
I.E.E.E.Press

ISBN
9780780357563


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