Test Conference 1998: International Conference Proceedings (Paperback)

by IEEE Inst of Electrical & Electronics, Institute of Electrical & Electronics Engineers, IEEE

Format: Paperback 1100 pages

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ITC is a technical conference on the testing and total quality of integrated electronic circuits, and the assemblies and systems that are based on them. This is a collection of papers covering topics such as; dynamic current testing; MCM systems design; memory test; and unpowered opens.

Book details

Published
31/01/1999

Publisher
I.E.E.E.Press

ISBN
9780780350922


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