19th IEEE Vlsi Test Symposium (Vts 2001) (Paperback)

by IEEE Computer Society, IEEE, PR&&&&

Format: Paperback 456 pages

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Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self-test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.

Book details

Published
31/05/2001

Publisher
I.E.E.E.Press

ISBN
9780769511221


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