Silver Metallization: Stability and Reliability - Engineering Materials and Processes (Paperback)

by Daniel Adams, Terry L. Alford, James W. Mayer

Format: Paperback 136 pages

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Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology. With the lowest resistivity of all metals, silver is an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the issues that have prevented silver from being used as an interconnect metal. The authors provide details on a wide range of experimental, characterization, and analysis techniques. The book is written for students, scientists, engineers, and technologists in the fields of integrated circuits and microelectronics research and development.

Book details

Published
16/12/2011

Publisher
Springer London Ltd

ISBN
9781849967051


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