Browse results

Showing 1-10 of 65 titles

1 1995 IEEE International Conference on Microelectronic Test Structures

by IEEE Electron Devices Society

Format: Paperback 250 pages
Published: 31/12/1995

Available to order

Usually despatched within 7 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


2 IEEE Recommended Practice for Latchup Test Methods for Cmos and Bicmos Integrated-Circuit Process Characterization

by IEEE Electron Devices Society

Format: Paperback 36 pages
Published: 31/12/1996

Available to order

Usually despatched in 2-3 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


3 International Microprocesses and Nanotechnology Conference 2000

by IEEE Electron Devices Society

Format: Paperback 230 pages
Published: 30/09/2000

Available to order

Usually despatched in 2-3 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


4 International Semiconductor Conference (CAS) 2000

by IEEE Electron Devices Society

Format: Paperback 600 pages
Published: 31/12/2000

Available to order

Usually despatched within 7 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


5 1999 4th International Symposium on Plasma Process-Induced Damage

by IEEE Electron Devices Society

Format: Paperback 224 pages
Published: 30/09/1999

Available to order

Usually despatched in 2-3 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


6 International Symposium on Semiconductor Manufacturing

by IEEE Industry Applications Society, IEEE Electron Devices Society, Ieee Institute of Electrical & Electron

Format: Paperback 350 pages
Published: 15/06/2006

Available to order

Usually despatched within 7 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


7 Integrated Optoelectronics : July 6-8, 1994 : Hyatt Regency Lake Tahoe Lake Tahoe, Nv/94th0606-4: Summer Topicals

by IEEE Electron Devices Society

Format: Paperback
Published: 15/06/2006

Available to order

Usually despatched within 7 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


8 Gaas Reliability Workshop, 1998

by IEEE Electron Devices Society

Format: Paperback 128 pages
Published: 31/10/1999

Available to order

Usually despatched in 2-3 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


9 Gaas IC Symposium

by IEEE Electron Devices Society, IEEE Industry Applications Society

Format: Paperback 348 pages
Published: 15/06/2006

Available to order

Usually despatched in 2-3 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)


10 Solid-State Sensors and Actuators (Transducers), 1997 9th International Conference

by Institute of Electrical & Electronics Engineers, IEEE Electron Devices Society

Format: Paperback 2000 pages
Published: 30/11/1997

Available to order

Usually despatched in 2-3 weeks

Overall rating

Bookseller (not yet rated)

Customer (not yet rated)